Contact Displacement Sensor
SDM Multi-Ten Thousand Digit Display Integrated Contact Displacement Sensor
Model：SDM万分数显一体接触式位移传感器
The SDM multi-dimensional integrated contact displacement sensor adopts the LVDT inductive measurement principle, integrating high-precision displacement measurement, numerical display, RS485 communication, and IO tolerance output. The product has a resolution of up to 0.1 μm and a repeatability of <1 μm. It can be used for height, thickness, depth, runout, vibration, flatness, and dimensional tolerance detection, and is suitable for automated equipment, precision tooling, online inspection systems, and upgrades to traditional dial indicators and electronic probes.
Send InquiryKey Features
- • LVDT inductive contact measurement offers excellent stability. Its 0.1 μm resolution is suitable for precision measurements at the 10,000-level. Repeatability <1 μm meets high-precision dimensional measurement requirements. The integrated digital display allows for real-time display of measured values. It supports RS485 communication and comes standard with Modbus-RTU protocol. It supports IO tolerance output and can detect upper and lower tolerance limits. Optional structures include spring-loaded, side-leaded, and pneumatic types. It supports data zeroing, upper and lower tolerance settings, and correction value settings. Its compact design supports DIN rail mounting. It is comparable to similar contact displacement measurement applications from Marposs, Marlboro, Climax, and Keyence.
Applications
- • Workpiece height inspection
- • Thickness measurement
- • Depth measurement
- • Runout inspection
- • Vibration displacement measurement
- • Dimensional tolerance inspection
- • Flatness inspection
- • Straightness inspection
- • Roundness and profile inspection
- • Online inspection of automated equipment
- • Precision tooling and fixture inspection
- • Automotive parts dimensional inspection
- • Bearing and mechanical parts inspection
- • Replacement for traditional dial indicators and electronic probes
Specifications
Full specification text
SDM万分数显一体接触式位移传感器参数表
| 量程规格 | 型号 | 外径 | 驱动方式 | 出线方式 | 测量力 | 线圈形式 | 分辨率 | 线性度 | 重复精度 | 疲劳寿命 |
|---|---|---|---|---|---|---|---|---|---|---|
| ±0.35 mm | SDM-07RG | - | 回弹式 | 直出 | 0.4 N | 全桥 | 0.1 μm | ±0.1% F.S. | 0.2 μm | 1000万次 |
| ±0.5 mm | SDM-07RX | - | 回弹式 | 直出 | 0.18 N | 全桥 | 0.1 μm | ±0.15% F.S. | 0.2 μm | 1000万次 |
| ±1 mm | SDM-02R | Φ8 mm | 回弹式 | 直出 | 0.9 N | 全桥 | 0.1 μm | ±0.1% F.S. | 0.3 μm | 1500万次 |
| ±2.5 mm | SDM-05RZ | Φ8 mm | 回弹式 | 直出 | 0.6 N | 全桥 | 0.1 μm | ±0.15% F.S. | 0.5 μm | 1500万次 |
| ±2.5 mm | SDM-05RL | Φ8 mm | 回弹式 | 侧出 | 0.6 N | 全桥 | 0.1 μm | ±0.15% F.S. | 0.5 μm | 1500万次 |
| ±5 mm | SDM-10RZ | Φ8 mm | 回弹式 | 直出 | 0.8 N | 全桥 | 0.1 μm | ±0.15% F.S. | 1 μm | 1500万次 |
| ±5 mm | SDM-10RL | Φ8 mm | 回弹式 | 侧出 | 0.8 N | 全桥 | 0.1 μm | ±0.15% F.S. | 1 μm | 1500万次 |
| ±5 mm | SDM-10PL | Φ8 mm | 气推式 | 直出 | 0.8 N | 全桥 | 0.1 μm | ±0.15% F.S. | 1 μm | 1500万次 |
数显控制器通用规格
| 项目 | 参数 |
|---|---|
| 产品类型 | 数显一体式接触位移传感器 |
| 可搭配传感器量程 | 回弹式2 mm / 5 mm / 10 mm，气推式10 mm，簧片式等 |
| 分辨率 | 0.1 μm |
| 重复精度 | ＜1 μm |
| 线性度 | ±0.1% |
| 供电电压 | DC24V |
| 功耗 | 1W |
| 工作温度 | -10～60℃ |
| 存储温度 | -20～70℃ |
| 产品尺寸 | 90 × 23 × 21 mm |
| 线长 | 2 m + 1 m，输出线1 m |
| 安装形式 | 标准DIN导轨 |
| 通讯接口 | RS485，Modbus-RTU协议 |
| IO输出 | 支持上公差、下公差超差输出 |
Model Selection
Full model selection text
SDM万分数显一体接触式位移传感器选型表
| 选型需求 | 推荐型号 | 量程规格 | 结构特点 | 适合场景 |
|---|---|---|---|---|
| 微小位移高精度检测 | SDM-07RG | ±0.35 mm | 回弹式，直出线，0.4 N测量力 | 精密高度、微小段差、轻接触检测 |
| 低测量力检测 | SDM-07RX | ±0.5 mm | 回弹式，直出线，0.18 N测量力 | 易变形工件、薄片、柔性材料检测 |
| 短行程精密测量 | SDM-02R | ±1 mm | Φ8 mm笔式结构，回弹式 | 高度、厚度、跳动、精密尺寸检测 |
| 常规尺寸检测 | SDM-05RZ | ±2.5 mm | Φ8 mm，直出线 | 自动化工装、设备在线检测 |
| 狭小空间安装 | SDM-05RL | ±2.5 mm | Φ8 mm，侧出线 | 安装空间受限、侧向布线场景 |
| 大行程接触测量 | SDM-10RZ | ±5 mm | Φ8 mm，直出线 | 厚度、深度、高度差和尺寸公差检测 |
| 大行程侧出线安装 | SDM-10RL | ±5 mm | Φ8 mm，侧出线 | 狭小设备空间、夹具内部安装 |
| 自动推出测头检测 | SDM-10PL | ±5 mm | 气推式，直出线 | 自动化夹具、节拍检测、需要主动伸缩测头的场景 |
选型建议
SDM系列适用于万分级接触式位移测量，分辨率为0.1 μm，可根据量程、测量力、出线方向和驱动方式进行选型。小量程型号适合微小位移和精密尺寸检测；Φ8 mm笔式结构适合设备集成和工装夹具安装；侧出线型号适合空间受限场景；气推式型号适合自动化检测节拍中需要主动推出测头的应用。可用于高度、厚度、深度、跳动、平面度、直线度及尺寸公差检测。