White light interferometric thickness sensor

I-series spectroscopic interferometric thickness sensor

The I-series white light interferometric thickness gauge adopts the principle of spectroscopic interferometry. By analyzing the interference signals formed by the reflected light from the upper and lower surfaces of the thin film, it achieves high-precision non-contact measurement of the thickness of transparent and semi-transparent thin films and coatings. The product features nanometer-level repeatability, a maximum sampling speed of 10 kHz, and a wide working distance range. It is suitable for thickness measurement of PCB protective coatings, PET multilayer films, UTG ultrathin flexible glass, wafer bonding layers, TSV through-silicon vias, and during grinding and polishing processes.