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Industry-based application content with inspection challenges, measurement solutions and recommended products.
Semiconductor
Wafer Step Height Inspection
Wafer Step Height Inspection provides stable measurement data for automation inspection.
Application Notes
ST-P Series Laser Displacement Sensors for Wafer Surface Height and Flatness Measurement
This article introduces the engineering application of ST-P series laser displacement sensors in wafer surface height, flatness, and warpage measurement, covering selection, installation, signal output, and precautions for semiconductor automation inspection.
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Application Notes
ST-P Series Laser Displacement Sensor in Probe Station Z-Axis Height Feedback Detection
This article introduces the application of ST-P series laser displacement sensors in semiconductor probe station Z-axis height feedback detection, including detection objects, pain points, selection suggestions, and installation precautions to help engineers achieve high-precision non-contact height measurement.
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Application Notes
Laser Displacement Sensor for Online Thickness Measurement of Lithium Battery Electrode Sheets
This article introduces the application of laser displacement sensors in online thickness measurement of lithium battery electrode sheets during coating and calendering processes. It highlights the technical advantages of the ST-P series high-precision laser triangulation sensors and compares three measurement schemes: single probe, dual probe through-beam, and reference surface measurement, providing selection guidance for lithium battery equipment manufacturers and automation engineers.
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Application Notes
ST-P Series Laser Displacement Sensors in Micro-Vibration and Stage Runout Detection for Semiconductor Equipment
This article introduces the application of ST-P series laser displacement sensors in micro-vibration and stage runout detection for semiconductor equipment, covering measurement objects, on-site challenges, installation methods, selection recommendations, and precautions for engineering reference.
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